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厂商索引:A-B-C-D-E-F-G-H-I-J-K-L-M-N-O-P-Q-R-S-T-U-V-W-X-Y-Z

BQ2203A

器件描述:NV Controller With Battery Monitor
器件厂商:TI [Texas Instruments]
厂商主页:http://www.ti.com/
文件大小:82.03KB,共12页
Sponsor by e络盟
器件资料摘要:
Features
Be4 Power monitoring and switching
for nonvolatile control of SRAMs
Be4 Write-protect control
Be4 Battery-low and battery-fail indi-
cators
Be4 Reset output for system power-on
reset
Be4 Input decoder for control of up to
2 banks of SRAM
Be4 3-volt primary cell input
Be4 3-volt rechargeable battery in-
put/output
General Description
The CMOS bq2203A SRAM Nonvolatile
Controller With Battery Monitor pro-
vides all the necessary functions for con-
verting one or two banks of standard
CMOS SRAM into nonvolatile
read/write memory. The bq2203A is
compatible with the Personal Computer
Memory Card International Association
(PCMCIA) recommendations for
battery-backed static RAM memory
cards.
A precision comparator monitors the 5V
V
CC
input for an out-of-tolerance condi-
tion. When out of tolerance is detected,
the two conditioned chip-enable outputs
are forced inactive to write-protect
banks of SRAM.
Power for the external SRAMs is
switched from the V
CC
supply to the
battery-backup supply as V
CC
de-
cays. On a subsequent power-up, the
V
OUT
supply is automatically
switched from the backup supply to
the V
CC
supply. The external SRAMs
are write-protected until a power-
valid condition exists. The reset out-
put provides power-fail and power-on
resets for the system. The battery
monitor indicates battery-low and
battery-fail conditions.
During power-valid operation, the
input decoder selects one of two
banks of SRAM.
1
1
PN220301.eps
16-Pin Narrow DIP or SOIC
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
CC
BC
S
CE
CE
CON1

CE
CON2
BCL
RST
NC
V
OUT
BC
P
NC
A
BCF
NC
THS
V
SS
bq2203A
Nov. 1994 B
Pin Connections
Two banks of CMOS static RAM can be battery-backed us-
ing the V
OUT
and the conditioned chip-enable output pins
from the bq2203A. As the voltage input V
CC
slews down
during a power failure, the two conditioned chip-enable
outputs, CE
CON1
and CE
CON2
, are forced inactive
independent of the chip-enable input CE.
This activity unconditionally write-protects external SRAM
as V
CC
falls to an out-of-tolerance threshold V
PFD
.V
PFD
is
selected by the threshold select input pin, THS. If THS is
tied to V
SS
, the power-fail detection occurs at 4.62V typical
for 5% supply operation.
If THS is tied to V
CC
, power-fail detection occurs at
4.37V typical for 10% supply operation. The THS pin
must be tied to V
SS
or V
CC
for proper operation.
If a memory access is in process to any of the two exter-
nal banks of SRAM during power-fail detection, that
memory cycle continues to completion before the memory
is write-protected. If the memory cycle is not terminated
within time t
WPT
(150µs maximum), the two chip-enable
outputs are unconditionally driven high, write-protecting
the controlled SRAMs.
Functional Description
NV Controller With Battery Monitor
Pin Names
VOUT Supply output
RST Reset output
THS Threshold select input
CE chip-enable active low input
CECON1, Conditioned chip-enable outputs
CECON2
A Bank select input
BCF Battery fail push-pull output
BCL Battery low push-pull output
BCP 3V backup supply input
BCS 3V rechargeable backup supply input/output
NC No connect
VCC 5-volt supply input
VSS Ground