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5962-8776601RA

器件描述:HEX 2-INPUT NAND DRIVERS
器件厂商:TI [Texas Instruments]
厂商主页:http://www.ti.com/
文件大小:439.32KB,共13页
Sponsor by e络盟
器件资料摘要:
SN54ALS804A, SN54AS804B, SN74ALS804A, SN74AS804B
HEX 2-INPUT NAND DRIVERS

SDAS022C – DECEMBER 1982 – REVISED JANUARY 1995
Copyright  1995, Texas Instruments Incorporated
1POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
• High Capacitive-Drive Capability
• ′ALS804A Has Typical Delay Time of 4 ns
(C
L
= 50 pF) and Typical Power Dissipation
of 3.4 mW Per Gate
• ′AS804B Has Typical Delay Time of 2.6 ns
(C
L
= 50 pF) and Typical Power Dissipation
of Less Than 9 mW Per Gate
• Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs

description
These devices contain six independent 2-input
NAND drivers. They perform the Boolean
functions Y = A • B or Y = A + B in positive logic.
The SN54ALS804A and SN54AS804B are
characterized for operation over the full military
temperature range of –55°C to 125°C. The
SN74ALS804A and SN74AS804B are
characterized for operation from 0°C to 70°C.
FUNCTION TABLE
(each driver)
INPUTS
OUTPUT
A B
Y
H H L
L XH
XLH
logic symbol

logic diagram (positive logic)
1
1A
2
1B
4
2A
5
2B
7
3A
8
3B
12
4A
13
4B
&
1Y
3
2Y
6
3Y
9
4Y
11
15
5A
16
5B
18
6A
19
6B
5Y
14
6Y
17
1Y
3
1
1A
2
1B
2Y
6
4
2A
5
2B
3Y
9
7
3A
8
3B
4Y
11
12
4A
13
4B
5Y
14
15
5A
16
5B
6Y
17
18
6A
19
6B

This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1A
1B
1Y
2A
2B
2Y
3A
3B
3Y
GND
V
CC
6B
6A
6Y
5B
5A
5Y
4B
4A
4Y
SN54ALS804A, SN54AS804B ...J PACKAGE
SN74ALS804A, SN74AS804B . . . DW OR N PACKAGE
(TOP VIEW)
3 2 1 20 19
910111213
4
5
6
7
8
18
17
16
15
14
6A
6Y
5B
5A
5Y
2A
2B
2Y
3A
3B
SN54ALS804A, SN54AS804B . . . FK PACKAGE
(TOP VIEW)
1Y 1B 1A
4A 4B
6B
3Y
GND
4Y
V
CC
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.