ADS8412
器件描述:16-BIT, 2 MSPS, UNIPOLAR DIFFERENTIAL INPUT, MICROPOWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE
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器件资料摘要:
FEATURES APPLICATIONS
DESCRIPTION
CDAC_
+
Output
Latches
and
3-State
Drivers
BYTE
16-/8-Bit
Parallel DATA
Output Bus
SAR
Conversion
and
Control Logic
Comparator
Clock
+IN
-IN
REFIN
CONVST
BUSY
CS
RD
RESET
4.096-V
Internal
Reference
REFOUT
ADS8412
SLAS384A – JUNE 2003 – REVISED DECEMBER 2004
16-BIT, 2 MSPS, UNIPOLAR DIFFERENTIAL INPUT, MICROPOWER SAMPLING
ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE
• DWDM• 2-MHz Sample Rate
• Instrumentation• 16-Bit NMC Ensured Over Temperature
• High-Speed, High-Resolution, Zero Latency• Zero Latency
Data Acquisition Systems• Unipolar Differential Input Range: V
ref to -V ref • Transducer Interface
• Onboard Reference • Medical Instruments
• Onboard Reference Buffer • Communication
• High-Speed Parallel Interface
• Power Dissipation: 175 mW at 2 MHz Typ
• Wide Digital Supply The ADS8412 is a 16-bit, 2 MHz A/D converter with
an internal 4.096-V reference. The device includes a• 8-/16-Bit Bus Transfer
16-bit capacitor-based SAR A/D converter with in-• 48-Pin TQFP Package
herent sample and hold. The ADS8412 offers a full• ESD Sensitive - HBM Capability of 500 V,
16-bit interface and an 8-bit option where data is read1000 V at All Input Pins
using two 8-bit read cycles.
The ADS8412 has a unipolar differential input. It is
available in a 48-lead TQFP package and is
characterized over the industrial -40 ° C to 85 ° C tem-
perature range.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright © 2003 – 2004, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.